2023 Top Upcoming Calls for Participation
Last Updated: 13 March 2023
The IEEE Computer Society is home to 217+ active technical standards, which promote the implementation of technologies moving humanity forward.
We’ve put together the most up-to-date opportunities for you to get involved in shaping the future standards in your technical domain in 2023.
Bookmark this page and come back regularly to see the most current calls for participation.
Calls for Participation
IEEE P3348™, Recommended Practice for the Framework and Evaluation Methods of Two-Dimensional (2D) Real-Person Digital Clothes Model Generation System Based on Artificial Intelligence
IEEE Standards Association (IEEE SA) invites you to participate in the Working Group for IEEE P3348™, Recommended Practice for the Framework and Evaluation Methods of Two-Dimensional (2D) Real-Person Digital Clothes Model Generation System Based on Artificial Intelligence.
WHY GET INVOLVED
This standard defines a framework including requirements and evaluation methods for a two-dimensional (2D) real-person digital clothes model generation system using artificial intelligence (AI). The framework includes functional modules and the input/output interfaces of the 2D real-person digital clothes model generation system. The input interface includes pictures of the clothes to be presented, clothes measurements, and model types, while the output interface provides a mechanism to export images of the generated models in clothes and multiple postures. The framework also includes modules for digital model face generation, clothes generation, digital model posture generation, and image fusion. Methods for evaluating the generated 2D real-person digital clothes models are also specified in this standard.
The purpose of this standard is to provide guidance for individuals and organizations to develop systems for generating 2D real-person digital clothes models based on AI. It can be used by developers and users of the systems and third-party evaluation laboratories to evaluate the generated 2D digital real-person clothes models.
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For additional information, contact the IEEE P3348™ Working Group Chair, Qing An, at anqing.aq@alibaba-inc.com or the IEEE SA Program Manager, Christy Bahn, at c.bahn@ieee.org.
IEEE P3120.1™, Standard for Quantum Simulator Architecture
IEEE Standards Association (IEEE SA) invites you to participate in the Working Group for IEEE P3120.1™, Standard for Quantum Simulator Architecture.
WHY GET INVOLVED
This standard defines technical architectures for quantum simulators based on technological type (e.g., analog quantum simulator) and one or more quantum objects (e.g., neutral atoms) or quantum systems (e.g., arrays of optically trapped atoms). It further defines the hardware and software components (e.g., quantum operating device) of quantum simulators, and excludes any mathematical construct that can be used to describe the time evolution of a quantum system of interest known as Hamiltonian.
The purpose of this standard is to describe the unique characteristics of quantum simulator architectures that are not fully captured in related standards development activities, as quantum simulators are a unique branch of quantum-driven devices within quantum technologies more generally.
MEETING INFORMATION
Date: Monday, 27 March 2023
Time: 10:00 AM ET
This meeting will be held via Webex.
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For additional information, contact the IEEE P3332™ Working Group Chair, Catherine Lefebvre, at catherine.lefebvre@pasqal.com or the IEEE SA Program Manager, Tom Thompson, at thomas.thompson@ieee.org.
IEEE P3338™, Guide for Framework for Data Contribution Evaluation in Federated Machine Learning
IEEE Standards Association (IEEE SA) invites you to participate in the Working Group for IEEE P3338™, Guide for Framework for Data Contribution Evaluation in Federated Machine Learning.
WHY GET INVOLVED
This guide provides data contribution measurement methods for federated machine learning. It provides guidance with respect to data trading feasibility for federated machine learning. It also describes three main aspects:
- Framework for data contribution evaluation of federated machine learning
- Specific scenario under data contribution
- Measurement methods for data contribution of federated machine learning
MEETING INFORMATION
Date: Friday, 31 March 2023
Time: 9:00 AM – 5:00 PM (GMT+8)
This meeting will be held in-person at:Luxemon Hotel (Pudong Shanghai) and New Int’l Expo Center in Pudong, Shanghai, China. Teleconference details will also be available.
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For additional information, contact the IEEE P3338™ Working Group Chair, Chen Jianing, at shsa@chinatelecom.cn or the IEEE SA Program Manager, Christy Bahn, at c.bahn@ieee.org.
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Employing a customized platform with proven, stable, and easy-to-use GitLab software and Mattermost team collaboration and messaging, IEEE SA OPEN provides the ability to create, test, manage, and deploy innovative projects in a collaborative, safe, and responsible environment.
IEEE SA OPEN provides infrastructure for open software, open hardware, and open data projects with:
- Community management
- DevOp infrastructure
- Governance
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Learn more about standards activities at the IEEE Computer Society
Past Calls for Participation
IEEE P1450.1™, Standard for Extensions to Standard Test Interface Language (STIL) (IEEE 1450-1999™) for Semiconductor Design Environments
IEEE Standards Association (IEEE SA) invites you to participate in the Working Group for IEEE P1450.1™, Standard for Extensions to Standard Test Interface Language (STIL) (IEEE 1450-1999™) for Semiconductor Design Environments.
WHY GET INVOLVED
This standard defines structures in STIL to support usage as semiconductor simulation stimulus; including:
- Mapping signal names to equivalent design references
- Interface between Scan and Built-In Self-Test (BIST), and the logic simulation
- Data types to represent unresolved states in a pattern
- Parallel or asynchronous pattern execution on different design blocks
- Expression-based conditional execution of pattern constructs.
It also defines structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test as well as to relate fail information from device testing environments back to original stimulus and design data elements.
The purpose of this standard is to enhance the STIL language definition to support the usage of STIL in the design environment, define extensions to support the definition of sub element tests, and the mechanisms to integrate those tests into a complete device test. Lastly, it defines the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
MEETING INFORMATION
Date: Tuesday, 14 March 2023
Time: 12:00 PM ET (9:00 AM PT)
This meeting will be held virtually via Webex.
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For additional information, contact the IEEE P3164™ Working Group Chair, Ric Dokken, at ric.dokken@ieee.org or the IEEE SA Program Manager, Tom Thompson, at thomas.thompson@ieee.org.
IEEE P3332™, Standard for Control-Oriented System Safety Analysis
IEEE Standards Association (IEEE SA) invites you to participate in the Working Group for IEEE P3332™, Standard for Control-Oriented System Safety Analysis.
WHY GET INVOLVED
Where traditional hazard analyses such as Failure Modes and Effects Analysis, and Fault Tree Analysis look at accidental harm as caused by failure, control-oriented safety analysis is different in that it looks at accidental harm first as caused by inadequate control. Failure plays a role in the control loops; however, control-oriented analysis makes failure subject to control. Without the primacy of failure, control-oriented safety analysis avoids the probabilistic nature of the traditional analyses. The absence of a probabilistic nature makes control-oriented analysis suitable for software-intensive systems.
More information can be found on the PAR.
MEETING INFORMATION
Date: Wednesday, 01 March 2023
Time: 9:00 AM – 1:00 AM ET (14:00 – 15:00 UTC)
This meeting will be held via Webex.
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For additional information, contact the IEEE P3332™ Working Group Chair, Rob Schaaf, at rjschaaf@ieee.org or the IEEE SA Program Manager, Christy Bahn, at c.bahn@ieee.org.
